2008 Variable Plot Sampling (Bitterlich) Short Course by John Bell and Kim Iles, June 11-13, Warsaw, Poland.


June 11-13,2008
WAU Campus
Nowoursynowska, Warsaw, Poland 02-776

Registration Form

The course is designed to update professionals both on the basics and on the newest topics in "variable plot" sampling (also called angle-count, point sampling or prism cruising). This will be particularly informative for those who are not familiar with the North American forest sampling industry. The teaching language will be English. The course will cover the latest research and field developments on the topic, as well as the practical issues of carrying out an angle?count sample in small and large inventory projects. Additional mention will be made of 3P sampling procedures.

Please fill in the registration below and send the payment to one of the authors of the course.  Send checks to:

John Bell & Associates
465c NEW Elizabeth Dr.
Corvallis, Oregon 97330 USA

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    Main page

    List of course topics

    Brief History of Variable Probability Sampling. Bitterlich and other key players.

    Basic Philosophical approach of the sampling system.

    Relative Measurement & percentage calculations.

    Development of the method in North America.

    Measurement of stand Basal Area vs. “Volume - Basal Area Ratio” for Sample Trees.

    What is the principle? Conversion values to extend basal area.

    North American experience in implementation.

    “Big BAF” method. Other “measure tree” selection techniques.

    Additional Field Issues.

    Selection of angle to use, Error reduction.

    Rare Species. Instruments to use. Borderline trees.

    Statistical issues regarding field effort and sampling error.

    Basic computation approaches (ratio conversion, individual tree expansion)

    Bruce’s formula, Balance Ratio. Total Sampling error computation.

    Sampling errors for value and any other units.

    Edge Effect processes to insure unbiasedness.

    Avoidance error, folding techniques, rotation techniques, exterior techniques.

    Permanent Sample Plot Developments.

    Critical Height based methods.

    Higher efficiency of VP sampling for permanent plots.



    If you still have some questions, please feel free to email organizer John Bell